Predicting Cone Quantum Catches under Illuminant Change
Finlayson, G., Funt, B., and Jiang, H.,
"Predicting Cone Quantum Catches under Illuminant Change",
Proceedings of the Eleventh Color Imaging Conference, Scottsdale, Nov.
2003.
Abstract:
Given LMS cone quantum catches from a surface
under a first illuminant what is the best method of
predicting what the corresponding quantum catches will be
for the same surface under a second illuminant given only
the quantum catches of a white surface under both
illuminants? The von Kries rule is one well known
method. In this paper, two new prediction methods along
with a variation on an existing third method are introduced
and then compared experimentally. In contrast to the von
Kries rule which is equivalent to a diagonal transformation,
all three methods estimate a full 3-by-3 linear
transformation mapping LMS values between illuminants.
All the new methods perform better than the von Kries
rule.
Full text (pdf)
Back to SFU Computational Vision Lab publications
(home)